JEITA EIAJ Standards (as of August in ). General System, Category and Title , Spec. No. (Test No.) Life Test, JEITA EIAJ ED/ Life TestⅠ, Steady. Japan Electronics and Information Technology Industries Association (JEITA) Standards EIAJ ED/ Environmental and endurance test methods for. EIAJ ED/ Test Method Ta=85°C, 85%RH, Vcc=80V, Vdd=6V. hrs. 0/ AC. EIAJ ED B Ta=°C,%RH.
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JEITA standards are established independently to any existing patents on the products, materials or processes they cover. JEITA assumes absolutely no responsibility toward parties applying these standards or toward patent owners. No part of this standards may be reproduced in any form or by any means without prior permission in writing from the publisher. The semiconductor devices provided for the tests.
The semiconductor devices 47001 are made with the object of being mounted on printed circuit boards by means of the surface mounting method.
The equipment used to test the specimens. The materials used to test the specimens. The sequence according to which the various kinds of treatments, measurements, conditionings, eiah, etc. The treatment which the diaj are submitted to before carrying out the initial measurements and tests.
The pre-treatment, equivalent to the humidity absorption which occurs during the storage period until the actual mounting by soldering, which the specimens are submitted to before the soldering process. The heating treatment, equivalent to the actual mounting by soldering, which the specimens are submitted to.
The visual inspection and the electrical and optical measurements which the specimens are submitted to 44701 the first place before carrying out the tests. The treatment which the specimens are submitted to before carrying out the end-point measurements with the object eliminating all factors except the influence exerted by the tests in question.
The visual inspection and the electrical and optical measurements that are carried out after finishing the tests.
The temperature of the air surrounding the specimen. The temperature of the air at a place separated by a distance sufficient to neglect the influence of the heat radiation from the specimen, when it is cooled by natural convection.
In conformity the relevant specifications when the specimen is cooled by forced convection. The ambient temperature when the specimen is eisj in inoperative state. The ambient temperature in operating state. The junction temperature of the specimen. Indicates the value under ordinary operating conditions. The temperature on the surface of the specimen at the point specified in the relevant specifications. The temperature edd the reference point specified in the relevant specifications.
The directions of the specimen are defined as shown in Figures 1 to 8. When the specimen eiau outward appearance different from those ones shown in the figures, its directions are defined in the relevant specifications.
SiC Power Device
Moreover, during the electrical measurements, the measurement conditions should not exceed the maximum ratings. In particular, utmost attention should be paid to the precautions indicated in the detail specifications. Standard diagram and category are shown in Figure 9, and Table 1. The standards related to integrated circuits IC and separate volume Appendix 7401 been published, and the standards related to discrete devices SD separate volume Appendix and separate volume Appendix had been published.
The 4 Appendixes confused the newest specification searching.
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Example, too many times and a few mistaking between the newest version and old version. Main revision points are as follow. The life tests and the strength tests was subdivided according to the revision frequency. A new and old classification method is shown in Comment Table 1.
Mechanical test methods B: Climatic test methods C: Miscellaneous test methods 2 Endurance tests Test by devices D: Individual specifications on each test methods had been proposed in considering process, but this proposal was not realized. The final revision planing was decided to above-mentioned 6 separate volumes.
But, the new endurance test methods become to 2 kinds of specific test methods that are endurance test and e operation life test.
Below are listed the members of deliberation of this standard. Osamu Nakayama Kawasaki Microelectronics, Inc. Shizuo Kunita Sanken Electric Co. Toru Katou Sanyo Electric Co. Nobuyuki Kawayoshi Sharp Corp. Makoto Kanayama Shindengen 7401 Mfg. Hiroyoshi Odaira Seiko Epson Corp. Atsushi Natsume Sony Corp. Tetsuji Matsuura Toshiba Corp. Toshiki Yamaguchi Fujitsu Ltd. Naohiro Yasuda Fuji Electric Co.
Junichi Mitsuhashi Mitsubishi Electric Corp. Masashi Kusuda Mitsumi Electric Co. Kohki Ohara Ricoh Co. Takahiro Ito Rohm Co. Kouji Obinata Sony Corp.